398 |
104-1
|
研究獎勵
|
Optimal decisions on the accelerated degradation test plan under the Wiener Process
|
399 |
104-1
|
研究獎勵
|
Efficient Bayesian sampling plans for exponential distributions with type-I censored samples
|
400 |
104-1
|
研究獎勵
|
Sensitivity analysis of sample allocation and measurement frequency under a degradation test with Gamma process
|
401 |
104-1
|
研究獎勵
|
Economic design of two-stage control charts with skewed and dependent measurements
|
402 |
103-2
|
會議論文
|
A note for using Brownian motion process and Gamma process methods for two-variable accelerated degradation tests
|
403 |
103-2
|
會議論文
|
Parameter Estimation of the Burr Type XII Distribution with a Progressively Interval-Censored Scheme Using Genetic Algorithm
|
404 |
105-1
|
研發處: 研究計畫 (國科會)
|
演化式計算法與考慮產品異質性的雙應力加速衰退測試方法之研究(2/2)
|
405 |
105-1
|
教學計畫表
|
統計二:高等統計學 TLSXB2M0322 0A
|
406 |
105-1
|
教學計畫表
|
統計二:管理數學 TLSXB2M0404 0B
|
407 |
105-1
|
教學計畫表
|
運管一:統計學 TLTXB1M0517 1B
|
408 |
88-1
|
期刊論文
|
臺灣地區人壽保險之財務績效評估
|
409 |
105-1
|
教學計畫表
|
運管一:統計學 TLTXB1M0517 1A
|
410 |
104-1
|
會議論文
|
Economic design of two-stage control charts for dependent measurements under the skew-normal distribution
|
411 |
103-2
|
參與學術服務
|
Reviewer
|
412 |
103-2
|
參與學術服務
|
Reviewer
|
413 |
104-2
|
論文指導
|
統計一碩士班 李依潔
|
414 |
104-2
|
論文指導
|
統計一碩士班 楊瑾棋
|
415 |
97-1
|
期刊論文
|
Reliability sampling plans for Weibull distribution with limited capacity of test facility
|
416 |
104-1
|
教學研習
|
商管學院定期學術專題研討會(2016-01-11 17:00:00 ~ 21:00:00)
|
417 |
104-2
|
教學計畫表
|
統計二:高等微積分 TLSXB2S0210 0A
|
418 |
104-2
|
教學計畫表
|
統計一:統計學 TLSXB1M0517 2A
|
419 |
104-2
|
教學計畫表
|
統計一碩士班:實驗設計 TLSXM1S0408 0A
|
420 |
104-1
|
教學研習
|
教師專業成長社群-大數據知識探索-5(2016-01-08 12:00:00 ~ 14:00:00)
|
391 |
90-2
|
期刊論文
|
A modified short-run type II continuous sampling plan
|
392 |
105-1
|
學術演講
|
Statistical Methods for Profile Monitoring
|
393 |
105-1
|
會議論文
|
Empirical Bayesian Strategy for Sampling Plans with Warranty under Truncated Censoring
|
394 |
104-2
|
會議論文
|
Accelerated Degradation Tests
|
395 |
104-2
|
會議論文
|
MEWMA Control Chart and Process Capability Indices for Simple Linear Profiles with With-Profile Autocorrelation
|
396 |
104-2
|
會議論文
|
Study for Reaching a Degradation Test Plan
|
397 |
104-1
|
研究獎勵
|
On monitoring of multiple non-linear profiles
|