Electronic structure of the carbon nanotube tips studied by x-ray-absorption spectroscopy and scanning photoelectron microscopy
學年 91
學期 1
出版（發表）日期 2002-11-01
作品名稱 Electronic structure of the carbon nanotube tips studied by x-ray-absorption spectroscopy and scanning photoelectron microscopy
作品名稱（其他語言）
著者 Chiou, J. W.; Yueh, C. L.; Jan, J. C.; Tsai, H. M.; Pong, W. F.; Hong, I.-H.; Klauser, R.; Tsai, M.-H.; Chang, Y. K.; Chen, Y. Y.; Wu, C. T.; Chen, K. H.; Wei, S. L.; Wen, C. Y.; Chen, L. C.; Chuang, T. J.
單位 淡江大學物理學系
出版者 College Park: American Institute of Physics
著錄名稱、卷期、頁數 Applied Physics Letters 81(22), pp.4189-4191
摘要 Angle-dependent x-ray absorption near edge structure (XANES) and scanning photoelectron microscopy (SPEM) measurements have been performed to differentiate local electronic structures of the tips and sidewalls of highly aligned carbon nanotubes. The intensities of both π∗- and σ∗-band C K-edge XANES features are found to be significantly enhanced at the tip. SPEM results also show that the tips have a larger density of states and a higher C 1s binding energy than those of sidewalls. The increase of the tip XANES and SPEM intensities are quite uniform over an energy range wider than 10 eV in contrast to earlier finding that the enhancement is only near the Fermi level.
關鍵字 carbon nanotubes; XANES; electronic structure; photoelectron spectroscopy; microscopy
語言 en
ISSN 1077-3118 0003-6951
期刊性質 國外
收錄於
產學合作
通訊作者 Pong, W. F.
審稿制度
國別 USA
公開徵稿
出版型式 紙本 電子版
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