| Electronic states and structural characterization in single-crystal Fe-Ni-O alloy thin films grown by molecular beam epitaxy | |
|---|---|
| 學年 | 87 |
| 學期 | 1 |
| 出版（發表）日期 | 1999-01-01 |
| 作品名稱 | Electronic states and structural characterization in single-crystal Fe-Ni-O alloy thin films grown by molecular beam epitaxy |
| 作品名稱（其他語言） | |
| 著者 | Chang, C.L.; Chern, G.; Chen, C.L.; Hsieh, H.H.; Dong, C.L.; 彭維鋒; Pong, Way-faung; Chao, C.H.; Chien, H.C.; Chang, S.L.; 張經霖 |
| 單位 | 淡江大學物理學系 |
| 出版者 | |
| 著錄名稱、卷期、頁數 | Solid state communications 109(9), pp.599-604 |
| 摘要 | High quality epitaxial Fe3O4, NiO and a series of Fe1−xNixOy (0<x<1) thin films have been fabricated by molecular beam epitaxy. In situ reflection high energy electron diffraction (RHEED), ex situ X-ray diffraction (XRD), and X-ray absorption spectroscopy (XAS) studies have been carried out. It was observed that the crystal structure of all the Fe1−xNixOy films studied resemble that of the inverse spinel Fe3O4. The lattice spacing along the perpendicular direction as a function of x shows a minimum at x=0.5 instead of a linear variation indicating that the structures are different from a bulk ferrite Fe2NiO4-like phase. The XAS results are consistent with XRD results and further identify the cation distribution in Fe1−xNixOy system as x varies. The mechanism of the formation of the metastable phase and its implication on the magnetic properties of these Fe–Ni–O films are briefly discussed. |
| 關鍵字 | A. Thin films;C. NEXAFS;C. X-ray scattering;E. Synchrotron radiation |
| 語言 | en |
| ISSN | |
| 期刊性質 | 國內 |
| 收錄於 | |
| 產學合作 | |
| 通訊作者 | |
| 審稿制度 | 否 |
| 國別 | TWN |
| 公開徵稿 | |
| 出版型式 | ,電子版 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/72614 ) |
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