| X-ray-absorption spectroscopy of CoSi2 | |
|---|---|
| 學年 | 84 |
| 學期 | 2 |
| 出版（發表）日期 | 1996-06-01 |
| 作品名稱 | X-ray-absorption spectroscopy of CoSi2 |
| 作品名稱（其他語言） | CoSi2的X-ray吸收光譜研究 |
| 著者 | Pong, Way-faung; Chang, Y. K.; Mayanovic, R. A.; Ho, G. H.; Lin, H. J.; Ko, S. H.; Tseng, P. K.; Chen, C. T.; Hirya, A.; Watanabe, M. |
| 單位 | 淡江大學物理學系 |
| 出版者 | College Park: American Physical Society (APS) |
| 著錄名稱、卷期、頁數 | Physical Review B 53(24), pp.16510-16515 |
| 摘要 | X-ray-absorption near-edge structure (XANES) spectra of thin-film CoSi2 were measured at the Si K edge and Co L3 edge using the total electron yield mode. The Si K-edge results for CoSi2 showed a dramatic reduction of intensity in the first broad feature accompanied by a rise in a relatively strong and sharp feature at higher binding energies when compared to XANES spectra for crystalline Si. We attribute these two features to the Si 1s photoelectron excitations to a broad Si 3p nonbonding band and a relatively narrow band of hybridized Si p–Co 3d antibonding states, respectively. Analysis of the Co L3-edge white line spectra for CoSi2 reveals the appearance of a triple structure, which can be attributed to excitations to the unoccupied Co 3d nonbonding states and hybridized antibonding Co (3d,4s)–Si p states. |
| 關鍵字 | |
| 語言 | en |
| ISSN | 0163-1829 1095-3795 |
| 期刊性質 | |
| 收錄於 | |
| 產學合作 | |
| 通訊作者 | Ko, S. H. |
| 審稿制度 | |
| 國別 | USA |
| 公開徵稿 | |
| 出版型式 | 紙本 電子版 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/27768 ) |
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