Electronic and bonding structures of B-C-N thin films investigated by x-ray absorption and photoemission spectroscopy
學年 92
學期 2
出版（發表）日期 2004-07-01
作品名稱 Electronic and bonding structures of B-C-N thin films investigated by x-ray absorption and photoemission spectroscopy
作品名稱（其他語言）
著者 Ray, S. C.; Tsai, H. M.; Bao, C. W.; Chiou, J. W.; Jan, J. C.; Krishna Kumar, K. P.; Pong, W. F.
單位 淡江大學物理學系
出版者 College Park: American Institute of Physics
著錄名稱、卷期、頁數 Journal of Applied Physics 96(1), pp.208-211
摘要 X-ray absorption near-edge structure (XANES) and valence-band photoelectron spectroscopy (PES) were used to investigate the electronic and bonding structures of B-C-N thin films. The intensities of the sp2-bonded features in the C K-edge XANES spectra are found to generally decrease as the C concentration increases, whereas the intensities of the sp2-bonded features in the spectra of N K-edge XANES increase with the N concentration. The decrease of the intensities of the sp2-bonded features in the C and N K-edges XANES spectra correlates with the increase of the C/B and N/B concentration ratios and the increase of Young’s modulus. Valence-band PES spectra are found to be insensitive to the variations of the B and C concentrations in B-C-N compounds © 2004 American Institute of Physics.
關鍵字
語言 en
ISSN 0021-8979
期刊性質 國外
收錄於
產學合作
通訊作者
審稿制度
國別 USA
公開徵稿
出版型式 紙本
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