EXAFS studies of the microstructure of semiconductor alloys, defects, and metal-semiconductor interfaces
學年 76
學期 1
出版（發表）日期 1988-01-01
作品名稱 EXAFS studies of the microstructure of semiconductor alloys, defects, and metal-semiconductor interfaces
作品名稱（其他語言）
著者 Bunker, B. A.; Islam, Quazi T.; Bandyopadhyay, Pathikrit; 彭維鋒; Pong, Way-faung
單位 淡江大學物理學系
出版者 London: Academic Press
著錄名稱、卷期、頁數 Superlattices and Microstructures 4(4-5), pp.489-492
摘要 Recent applications of EXAPS spectroscopy are discussed: (1) Fe impurities implanted into Si occupy a distorted tetrahedral interstitial site where the first coordination shell expands about the impurity atom and the second shell contracts: (2) the local MnSe and ZnSe bond lengths in the diluted magnetic semiconductor Zn1−xMnxSe are constant within ∼0.01A even though the lattice constant as determined by x-ray diffraction varies by approximately 0.2 Å and the system undergoes a structural phase change; (3) the ferroelectric phase transition in Pb1−xGexTe has an order-disorder as well as displacive character; and (4) preliminary results show the feasibility of non-destructive measurement of a “buried” Al/GaAs interface.
關鍵字
語言 en
ISSN 0749-6036
期刊性質 國外
收錄於
產學合作
通訊作者
審稿制度
國別 GBR
公開徵稿
出版型式 紙本
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