期刊論文
| 學年 | 111 |
|---|---|
| 學期 | 2 |
| 出版（發表）日期 | 2023-03-31 |
| 作品名稱 | A New Multiple Dependent State Sampling Plan Based on One-Sided Process Capability Indices |
| 作品名稱（其他語言） | |
| 著者 | Yen, Ching-ho |
| 單位 | |
| 出版者 | |
| 著錄名稱、卷期、頁數 | The International Journal of Advanced Manufacturing Technology 126(7), 3297-3309 |
| 摘要 | Process capability indices (PCIs) are efective quality tools for evaluating process performance in the manufacturing industry. Over a period of more than 15 years, sampling plans based on PCIs have been developed for lot sentencing. Sampling plans that involve repetitive sampling or multiple dependent (deferred) state sampling achieve signifcant sample size reductions relative to sampling plans that involve single sampling. In this study, we combine the concepts of repetitive and multiple dependent state sampling to propose a new variable sampling plan based on one-sided PCIs. The proposed sampling plan minimizes the average sample number while satisfying the principle of two points on the operating characteristic curve. To demonstrate the performance of the proposed sampling plan, a comparison with existing homogeneous sampling plans is performed. |
| 關鍵字 | Process capability indices;Repetitive sampling;Multiple dependent state;Average sample number;Operating characteristic curve |
| 語言 | en_US |
| ISSN | 1433-3015 |
| 期刊性質 | 國外 |
| 收錄於 | SCI |
| 產學合作 | |
| 通訊作者 | |
| 審稿制度 | 是 |
| 國別 | TWN |
| 公開徵稿 | |
| 出版型式 | ,電子版 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/127259 ) |