期刊論文
學年 | 111 |
---|---|
學期 | 2 |
出版(發表)日期 | 2023-06-15 |
作品名稱 | Assessment of the Degradation Mechanisms of Cu Electrodes during the CO2 Reduction Reaction |
作品名稱(其他語言) | |
著者 | Rik V. Mom, Luis-Ernesto Sandoval-Diaz, Dunfeng Gao, Cheng-Hao Chuang, Emilia A. Carbonio, Travis E. Jones, Rosa Arrigo, Danail Ivanov, Michael Hävecker, Beatriz Roldan Cuenya, Robert Schlögl, Thomas Lunkenbein, Axel Knop-Gericke, and Juan-Jesús Velasco-Vélez |
單位 | |
出版者 | |
著錄名稱、卷期、頁數 | ACS Applied Materials & Interface 15(25), p.30052-30059 |
摘要 | Catalyst degradation and product selectivity changes are two of the key challenges in the electrochemical reduction of CO2 on copper electrodes. Yet, these aspects are often overlooked. Here, we combine in situ X-ray spectroscopy, in situ electron microscopy, and ex situ characterization techniques to follow the long-term evolution of the catalyst morphology, electronic structure, surface composition, activity, and product selectivity of Cu nanosized crystals during the CO2 reduction reaction. We found no changes in the electronic structure of the electrode under cathodic potentiostatic control over time, nor was there any build-up of contaminants. In contrast, the electrode morphology is modified by prolonged CO2 electroreduction, which transforms the initially faceted Cu particles into a rough/rounded structure. In conjunction with these morphological changes, the current increases and the selectivity changes from value-added hydrocarbons to less valuable side reaction products, i.e., hydrogen and CO. Hence, our results suggest that the stabilization of a faceted Cu morphology is pivotal for ensuring optimal long-term performance in the selective reduction of CO2 into hydrocarbons and oxygenated products. |
關鍵字 | CO2RR, copper degradation, in situ EC-SEM, in situ X-ray spectroscopy, long-term reactions, electrocatalysis |
語言 | en_US |
ISSN | 1944-8244; 1944-8252 |
期刊性質 | 國外 |
收錄於 | SCI |
產學合作 | |
通訊作者 | |
審稿制度 | 否 |
國別 | USA |
公開徵稿 | |
出版型式 | ,電子版 |
相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/125596 ) |