期刊論文
| 學年 | 103 |
|---|---|
| 學期 | 2 |
| 出版（發表）日期 | 2015-04-21 |
| 作品名稱 | Economic design of the life Test with a warranty policy |
| 作品名稱（其他語言） | |
| 著者 | Tzong-Ru Tsai; N Jiang; YL Lio |
| 單位 | |
| 出版者 | |
| 著錄名稱、卷期、頁數 | Journal of Industrial and Production Engineering 32(4), p.225-231 |
| 摘要 | Considering a warranty policy, an optimal truncated life test procedure is developed for the generalized exponential distribution. A total cost model, which involves the costs of testing, experimental time, lot acceptance or rejection, and the warranty, is adopted to establish the loss function of Bayesian decision method. A proper sample size of life test and an acceptance number of threshold are determined to minimize the expected total cost for lot decision. An example regarding the lifetime quality of integrated circuit products is used to demonstrate the proposed method. Numerical results have shown that the proposed method is beneficial for the reduction of expected total cost. |
| 關鍵字 | loss function;posterior density function;prior density function;truncated life test |
| 語言 | en_US |
| ISSN | 2168-1015; 2168-1023 |
| 期刊性質 | 國外 |
| 收錄於 | EI |
| 產學合作 | |
| 通訊作者 | YL Lio |
| 審稿制度 | 是 |
| 國別 | USA |
| 公開徵稿 | |
| 出版型式 | ,電子版 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/106158 ) |