期刊論文

學年 97
學期 1
出版(發表)日期 2008-09-04
作品名稱 Reliability sampling plans under progressive type-I interval censoring using cost functions
作品名稱(其他語言)
著者 Huang, S.-R.; Wu, S.-J.
單位
出版者
著錄名稱、卷期、頁數 IEEE Transactions on Reliability 57(3), p.445-451
摘要 This paper gives a reliability sampling plan for progressively type I interval censored life tests when the lifetime follows the exponential distribution. We use the maximum likelihood method to obtain the point estimation of the parameter of failure time distribution. We provide an approach to establish reliability sampling plans which minimize the total cost of life testing under given consumer's and producer's risks. Some numerical studies are investigated to illustrate the proposed approach.
關鍵字 exponential distribution;failure analysis;life testing;maximum likelihood estimation;reliability theory;sampling methods
語言 en_US
ISSN 0018-9529
期刊性質 國外
收錄於 SCI EI
產學合作
通訊作者 Wu, S.-J.
審稿制度
國別 USA
公開徵稿
出版型式 ,電子版,紙本
相關連結

機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/106163 )