期刊論文
| 學年 | 98 |
|---|---|
| 學期 | 1 |
| 出版（發表）日期 | 2009-12-01 |
| 作品名稱 | Evaluation of the Mean Life of LEDs under the Accelerated Degradation Test |
| 作品名稱（其他語言） | |
| 著者 | Tsai, Tzong-Ru; Lin, Chin-Wei; Chen, Chiu-Ling; Huang, Sheng-Bang |
| 單位 | 淡江大學統計學系 |
| 出版者 | Kumamoto: ICIC International |
| 著錄名稱、卷期、頁數 | ICIC Express Letters 3(4)pt.B, pp.1471-1476 |
| 摘要 | This paper provides a simple estimation procedure to evaluate the mean life to failure of high power light emitting diodes. An experiment of accelerated degradation test with high power light emitting diodes is conducted lasting 9022 hours. Degradation paths are collected and used to illustrate the proposed method. The example indicates that the proposed method works well, and it is easy to operate to engineers. |
| 關鍵字 | Degradation test;Inverse Gaussian distribution;Light emitting diodes;Lumen maintenance;Wiener Process |
| 語言 | en |
| ISSN | 1881-803X |
| 期刊性質 | 國外 |
| 收錄於 | EI |
| 產學合作 | |
| 通訊作者 | Tsai, Tzong-Ru |
| 審稿制度 | |
| 國別 | JPN |
| 公開徵稿 | |
| 出版型式 | 紙本 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/91600 ) |