期刊論文
| 學年 | 100 |
|---|---|
| 學期 | 2 |
| 出版（發表）日期 | 2012-07-13 |
| 作品名稱 | Inference from lumen degradation data under Wiener diffusion process |
| 作品名稱（其他語言） | |
| 著者 | Tsai, Tzong-ru; Lin, Chin-wei; Sung, Yi-ling; Chou, Pei-ting; Chen, Chiu-ling; Lio, Yuh-long |
| 單位 | 淡江大學統計學系 |
| 出版者 | IEEE Reliability Society |
| 著錄名稱、卷期、頁數 | IEEE Transactions on Reliability 61(3), p.710-718 |
| 摘要 | The lumen degradation of light emitting diodes subject to increasing stress loading is investigated by using a cumulative damage model. The cumulative damage process is taken as a Wiener diffusion process with a drift which depends on two stress loadings. General statistical inferences on the parameters and percentiles of the light emitting diode lifetime distribution are presented based on the cumulative damage measurements, collected from a two-variable constant-stress loading accelerated degradation test. Approximate lower s-confidence bounds of the light emitting diode lighting lifetime percentiles are given using the Fisher information of the maximum-likelihood estimators, and Bonferroni's inequality. The application of the proposed method is illustrated by a lumen cumulative damage data set of high power light emitting diodes. |
| 關鍵字 | Degradation;Loading;Stress;Load modeling;Maximum likelihood estimation;Light emitting diodes;Reliability |
| 語言 | en_US |
| ISSN | 0018-9529 |
| 期刊性質 | 國外 |
| 收錄於 | SCI |
| 產學合作 | |
| 通訊作者 | Lio, Yuh-long |
| 審稿制度 | 是 |
| 國別 | USA |
| 公開徵稿 | |
| 出版型式 | ,電子版 |
| 相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/78149 ) |