期刊論文
學年 | 99 |
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學期 | 2 |
出版(發表)日期 | 2011-03-01 |
作品名稱 | Optimal burn-in policy for highly reliable products using gamma degradation process |
作品名稱(其他語言) | |
著者 | Tseng, Sheng-tsaing; Balakrishnan, N.; Tsai, Chih-chun |
單位 | 淡江大學數學學系 |
出版者 | IEEE Reliability Society |
著錄名稱、卷期、頁數 | IEEE Transactions on Reliability 60(1), pp.234-245 |
摘要 | Burn-in test is a manufacturing process applied to products to eliminate latent failures or weak components in the factory before the products reach customers. The traditional burn-in test over a short period of time to collect time-to-failure or go/no-go data is rather inefficient. This decision problem can be solved if there exists a suitable quality characteristic (QC) whose degradation over time can be related to the lifetime of the product. Recently, optimal burn-in policies have been discussed in the literature assuming that the underlying degradation path follows a Wiener process. However, the degradation model of many materials (especially in the case of fatigue data) may be more appropriately modeled by a gamma process that exhibits a monotone-increasing pattern. Here, motivated by laser data, we first -propose a mixed gamma process to describe the degradation path of the product. Next, we present a decision rule for classifying a unit as typical or weak. A cost model is used to determine the optimal termination time of a burn-in test, and a motivating example is then presented to illustrate the proposed procedure. Finally, a simulation study is carried out to examine the effect of wrongly treating a mixed gamma process as a mixed Wiener process, and the obtained results reveal that the effect on the probabilities of misclassification is not negligible. |
關鍵字 | Burn-in test;degradation model;gamma process;highly reliable products;mixture distribution;Wiener process |
語言 | en_US |
ISSN | 0018-9529 |
期刊性質 | 國外 |
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相關連結 |
機構典藏連結 ( http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/58135 ) |